Trade fair highlight 03. April 2025
Technical Cleanliness Needs FT-IR | Because Residues Leave More Than Just Traces
Technical cleanliness is a key factor for the function, safety, and durability of components. Undetected residues, particles, or cross-contaminations can lead to failures, complaints, and high costs. These residues must be made visible and chemically understood – precisely, non-destructively, and reproducibly.
The LUMOS II FT-IR microscope from Bruker delivers exactly that. It enables fast and reliable identification of particles and contaminants directly on the surface of components. Chemical analysis is performed with pinpoint accuracy and without complex sample preparation – ideal for quality assurance, failure analysis, and process optimization.
Typical applications include:
- Chemical identification of individual particles
- Analysis of smearing, residues, and deposits
- Detection and clarification of cross-contaminations in production
- Cleanliness verification on PCBs and connector interfaces
- Inspection of mechanical components – efficient and non-destructive
The LUMOS II combines high-resolution FT-IR spectroscopy with fully automated microscopy and intuitive operation. Users benefit from reproducible results and easily interpretable data – regardless of experience level.
Talk to us about these highlights:
- ATR measurement with a robust, high-quality crystal – delivering maximum signal quality even on the smallest samples
- The practical TE-MCT detector, offering high sensitivity combined with easy handling
The LUMOS II FT-IR microscope from Bruker delivers exactly that. It enables fast and reliable identification of particles and contaminants directly on the surface of components. Chemical analysis is performed with pinpoint accuracy and without complex sample preparation – ideal for quality assurance, failure analysis, and process optimization.
Typical applications include:
- Chemical identification of individual particles
- Analysis of smearing, residues, and deposits
- Detection and clarification of cross-contaminations in production
- Cleanliness verification on PCBs and connector interfaces
- Inspection of mechanical components – efficient and non-destructive
The LUMOS II combines high-resolution FT-IR spectroscopy with fully automated microscopy and intuitive operation. Users benefit from reproducible results and easily interpretable data – regardless of experience level.
Talk to us about these highlights:
- ATR measurement with a robust, high-quality crystal – delivering maximum signal quality even on the smallest samples
- The practical TE-MCT detector, offering high sensitivity combined with easy handling
Bruker Optics GmbH & Co. KG
Contact
Mr. Dr. Simon Hugo Schlindwein